temporarily out of stock
Advances in Imaging and Electron Physics Volume 136
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Chapter 1 - Real and Complex PDE Based Schemes for Image Shaprening and Enhancement (GILBOA, SOCHEN and ZEEVI); Chapter 2 - The S - State Model for Electron Channeling in High Resolution Electron Microscopyv(GEUENS and VAN DYCK); Chapter 3 - Measurement of Electric Fields on Object Surface in an Emission Electron Microscope (NEPIJKO, SEDOV and SCHONHENSE)