temporarily out of stock
Advances in Imaging and Electron Physics Volume 134
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Chapter 1 - Circulant matrix representation of feature masks and its applications (PARK and CHA); Chapter 2 - Phase problem and reference beam diffraction (SHEN); Chapter 3 - Fractal encoding (VITULANO) Chapter 4 - Morphologically debiassed classifier fusion: A tomography-theoretic approach (WINDRIDGE)