temporarily out of stock
Advances in Imaging and Electron Physics, Volume 108
Martin Berz, Kyoko Makino, Khodr Shamseddine, Weishi Wan
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Dynamics. Beams and Beam Physics. Differential Equations, Determinism, and Maps. Lagrangian Systems. Hamiltonian Systems. Electrodynamics. Differential Algebraic Techniques. Function Spaces and their Algebras. Taylor Differential Algebras. Advanced Methods. Fields. Analytic Field Representation. Practical Utilization of Field Information. Maps: Calculation. The Particle Optical Equations of Motion. Equations of Motion for Other Quantities. Maps: Properties. Manipulations. Symmetries. Representations. Spectrometers. Introduction. Momentum Spectrometers. Mass Spectrometers. Reconstructive Correction of Aberrations. Aberration Correction via Repetitive Symmetry. Repetitive Systems. Linear Theory. Parameter Dependent Linear Theory. Normal Forms. Syplectic Tracking.