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Advances in Imaging & Electron Physics, Volume 106

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Advances in Imaging & Electron Physics, Volume 106

Benjamin Kazan, Tom Mulvey, Peter Hawkes

ISBN 0120147483
Pages 353

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

M.J. Deen, T.D. Hardy, and R. Murowinski, Effects of Radiation Damage on Scientific Charge Coupled Devices. C.M. Krowne, CAD Using Green's Functions and Finite Elements and Comparison to Experimental Structures for Inhomogeneous Microstrip Circulators. S. Marchard-Maillet and S. Antipolis, Discrete Geometry to Image Processing. H. Ozaktas, M.A. Kutay, and D. Mendlovi, Introduction to the Fractional Fourier Transform and Its Applications. E.H.K. Stelzer and F.M. Haar, Confocal Microscopy. Subject Index.